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A Novel Goodness of Fit Test Spectrum Sensing Using Extreme Eigenvalues, LI He, Zhao Wenjing, Liu Chang, Jin Minglu, Yoo Sang-Jo, Chinese Journal of Electronics, 2020
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날짜 2021-03-29 13:35:44
A Novel Goodness of Fit Test Spectrum Sensing Using Extreme Eigenvalues, LI He, Zhao Wenjing, Liu Chang, Jin Minglu, Yoo Sang-Jo, Chinese Journal of Electronics, 2020
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