INHA for the TALENT 인하와 성장하는 인재,
미래사회 핵심인재 Talent for the The FUTURE
국제학술지
Virtual Sample-based Deep Metric Learning using Discriminant Analysis, Dae Ha Kim and Byung Cheol Song, Pattern Recongnition, Pattern Recognition, 2021
작성자 관리자
날짜 2021-03-29 13:42:45
Virtual Sample-based Deep Metric Learning using Discriminant Analysis, Dae Ha Kim and Byung Cheol Song, Pattern Recongnition, Pattern Recognition, 2021
댓글 (0)
등록된 댓글이 없습니다.